Morphology-driven gas sensing by fabricated fractals: A review

• Vishal Kamathe and
• Rupali Nagar

Beilstein J. Nanotechnol. 2021, 12, 1187–1208, doi:10.3762/bjnano.12.88

• p-type), fermi level control theory, and grain boundary barrier control theory models have been proposed to understand the fundamentals of sensing mechanism [31][36][87][88]. The changes in electrical resistance of materials from a microscopic viewpoint are addressed by electronic and chemical

Advanced atomic force microscopy techniques II

• Thilo Glatzel,
• Ricardo Garcia and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2014, 5, 2326–2327, doi:10.3762/bjnano.5.241

• properties [21] are based on the implementation of proportional-integral controllers to give realistic feedback behaviours. Stirling proposed a theoretical model for studying the SPM feedback in the context of control theory providing the possibility to understand and model the performance from SPM systems

Methods for rapid frequency-domain characterization of leakage currents in silicon nanowire-based field-effect transistors

• Tomi Roinila,
• Xiao Yu,
• Jarmo Verho,
• Tie Li,
• Pasi Kallio,
• Matti Vilkko,
• Anran Gao and
• Yuelin Wang

Beilstein J. Nanotechnol. 2014, 5, 964–972, doi:10.3762/bjnano.5.110

• measurement results are more comprehensive. The theoretical backgrounds of the methods are introduced, followed by the experimental results from an n-type SiNW FET. Methods Consider the system g(t) shown in Figure 2 as a linear time-invariant system for small disturbances. According to basic control theory

Control theory for scanning probe microscopy revisited

• Julian Stirling

Beilstein J. Nanotechnol. 2014, 5, 337–345, doi:10.3762/bjnano.5.38

• Julian Stirling School of Physics and Astronomy, The University of Nottingham, University Park, Nottingham, NG7 2RD, United Kingdom 10.3762/bjnano.5.38 Abstract We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature

• a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation. Keywords: AFM; control theory; feedback; scanning probe microscopy

• successfully modelled and implemented proportional-differential controllers [8], but these are not commonly used. Previous work has used control theory to analyse the behaviour of PI and PID feedback loops in the context of SPM [9][10][11][12], and these models are still being applied in the current literature

High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

• John Melcher,
• David Martínez-Martín,
• Miriam Jaafar,
• Julio Gómez-Herrero and
• Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

• controllers. It is straightforward to prove these results by substituting Equation 8 into Equation 3 and solving for the equilibrium points and the eigenvalues of the Jacobian matrix or by using standard tools for control theory [18]. Limitations in the control of the amplitude and phase lag are introduced

Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids

• Miriam Jaafar,
• David Martínez-Martín,
• Mariano Cuenca,
• John Melcher,
• Arvind Raman and
• Julio Gómez-Herrero

Beilstein J. Nanotechnol. 2012, 3, 336–344, doi:10.3762/bjnano.3.38

• precaution. Acquiring images in DAM is easy and direct. It is also possible to select the optimum cantilever oscillation amplitude for each experiment, ranging from less than 1 nm up to tens of nanometers at high scan speeds. It is known from control theory [25] that a feedback loop can modify the